Scanning-Ion Microscopy with Polarization Analysis (Simpa)
نویسندگان
چکیده
منابع مشابه
Scanning Electron Microscopy with Polarization Analysis (sempa) and Its Applications
Scanning Electron Microscopy with Polarization Analysis (SEMPA) is a technique for directly imaging the magnetic microstructure of surfaces and thin films. SEMPA relies on the fact that secondary electrons emitted from a magnetic sample in a Scanning Electron Microscope (SEM) have a spin polarization which reflects the net spin density in the material. This spin density, in turn, is directly re...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملAnalysis of leaf surfaces using scanning ion conductance microscopy.
Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax-like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques ...
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ژورنال
عنوان ژورنال: MRS Proceedings
سال: 1993
ISSN: 0272-9172,1946-4274
DOI: 10.1557/proc-313-723